Kód

Leírás

Kiszerelés

NIST-674b

X-Ray Powder Diffraction Intensity Set (Quantitative Powder Diffraction Standard)

10 g (powder)

NIST-3600

Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering

coupon

NIST-1979

Powder Diffraction Line Profile Standard for Crystallite Size Analysis (Nano-Crystalline ZnO Powder)

2 x 3 g

BAM-EDS-TM002 with Software (Multiple license)

Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm + CD-ROM (in English und German)

ea

BAM-EDS-TM002 with Software (Individual license)

Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm + CD-ROM (in English und German)

ea

BAM-EDS-TM002

Test material for the performance check of an X-ray spectrometer attached to a SEM, compact material, dimensions 8 mm x 8 mm x 0,5 mm

ea

NIST-640e

Silicon powder line position + line shape standard for powder diffraction

7,5 g

NIST-2000

Calibration standard for high-resolution X-Ray Diffraction

1 block

NIST-1995

Standard Sapphire Single Crystal Wafer for Crystalline Orientation

50-mm wafer

NIST-1994

Standard Silicon Single Crystal Wafer for Crystalline Orientation

100-mm wafer